The Anritsu MP1800A Signal Quality Analyser is an expandable plug-in modular BERT with built-in Pulse Pattern Generator (PPG) supporting output of high-quality, high-amplitude signals, Error Detector (ED) with high input sensitivity supporting signal analysis, such as Bathtub Jitter and Eye Diagram Measurements, plus a jitter modulation source for generating various jitters, such as SJ/RJ/BUJ/SSC, and supporting Jitter Tolerance tests.
The Anritsu MP1800A supports wideband bit rates from 0.1 to 32.1 Gbit/s for versatile signal integrity analysis applications up to 32 Gbit/s, such as 100GbE (25G x 4), OTU-4 (28G x 4), 32G DP-QPSK, CEI-28G, 32G FC, and Infiniband EDR (26 G). Combination with the Anritsu MP1821A and the Ansritsu MP1822A supports BER tests up to 56 Gbit/s for next-generation R&D, including CEI-56G-VSR.
1, 2, or 4 channels can be selected per PPG or ED module, supporting multi-channel synchronisation for up to 8 channels at 32 Gbit/s. AOC, QSFP+, CXP and CFP modules can be measured simultaneously, and crosstalk and skew tolerance can be evaluated.
Combined use with the Anritsu MP1825B 4Tap Emphasis generates 2 and 3-tap pre-emphasis signals for high-speed interconnects up to 32.1 Gbit/s, such as CEI-28G, 32G FC and Infiniband EDR (26G), as well as 4-tap signals. The pre-emphasis effect is easily confirmed because each tap can be changed independently.
Installing the Anritsu MP1825B 4Tap emphasis as a remote head for the Anritsu MP1800A close to the DUT keeps cables short and signal quality high. Precision signal integrity analysis is supported by pre-emphasis corrected accurate Jitter Tolerance tests with transparent input data and clock jitter .
The all-in-one Anritsu MP1800 series outputs high-amplitude signals up to 3.5 Vp-p for evaluation of EA and EML modulators, improving optical modulator R&D, line productivity, and quality.
With support for optical interfaces, the Anritsu MP1800A is ideal for IEEE802.3-2005 10GBASE-L and E stressed receiver conformance tests. The high-accuracy auto-calibration function assures excellent measurement reproducibility and interconnectivity.
In addition to generating IEEE and ITU-T burst data and auxiliary signals for evaluating E-PON, G-PON, and 10GE-PON optical modules, automated timing of the burst data and auxiliary signal outputs shortens evaluation times and increases evaluation quality.
- Wide Bandwidth 0.1 Gbit/s to 32.1 Gbit/s with configurations up to 56 Gbit/s
- High-quality, Low-jitter Waveforms
- Up to 32.1 Gbit/s Jitter Tolerance Tests (SJ, RJ, BUJ, SSC, 2-tone SJ)
- High Input Sensitivity and Wide Phase Margin – Signal Quality Analysis
- Burst Measurement for PON and Loop Circuit measurements
- Optical Interfaces
- Crosstalk tests using multi-channel configuration (8 ch)