Benefits and Features

Keithley 4200A-SCS Parameter Analyzer: Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. 

Parametric insight, fast and clear: 4200A-SCS Parameter Analyzer reduces characterization complexity and test setup by up to 50%, providing clear, uncompromised measurement and analysis capability. Plus, embedded measurement expertise—an industry first—provides test guidance and gives you supreme confidence in your results.

• Built-in measurement videos in English, Chinese, Japanese, and Korean
• Jump start your testing with hundreds of user-modifiable application tests
• Automated real-time parameter extraction, data graphing, arithmetic functions

Measure. Switch. Repeat: 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. The four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.

• Move C-V measurement to any device terminal without re-cabling
• User-configurable for low current capability
• Personalize the names of output channels
• View real-time test status

Characterize. Customize. Maximize.: 4200A-SCS is completely customizable and fully upgradeable so you can perform electrical characterization and evaluation of semiconductor devices, new materials, active/passive components, wafer level reliability, failure analysis, electrochemistry or virtually any type of sample.

• NBTI/PBTI testing
• Random telegraph noise
• Non-volatile memory devices
• Potentiostat application tests

Integrated solution with analytical probers and cryogenic controllers: The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.

• “Point and click” test sequencing
• “Manual” prober mode tests prober functionality
• Fake prober mode enables debugging without removing commands

4200A-SCS-PK1 – High Resolution IV

• 210V/100mA, 0.1 fA resolutionFor two- and three-terminal devices, MOSFET, CMOS characterization Package 4200A-SCS-PK1 includes:
  • 4200A-SCS parameter analyzer
  • (2) 4200-SMU Module
  • (1) 4200-PA Preamp
  • (1) 8101-PIV Test fixture with sample devices

4200A-SCS-PK2 – High Resolution IV & CV

• 210V/100mA, 0.1 fA resolution, 1kHz – 10MHzFor high κ dielectric, deep submicron CMOS characterization Package 4200A-SCS-PK2includes:
  • 4200A-SCS parameter analyzer
  • (2) 4200-SMU Module
  • (1) 4200-PA Preamp
  • (1) 4210-CVU Capacitance-Voltage Module
  • (1) 8101-PIV Test fixture with sample devices

4200A-SCS-PK3 – High Resolution and Power IV & CV

• 210V/1A, 0.1 fA resolution, 1kHz – 10MHzFor power devices, high κ dielectric, deep submicron CMOS device characterization Package 4200A-SCS-PK3 includes:
  • 4200A-SCS parameter analyzer
  • (2) 4200-SMU Module
  • (2) 4210-SMU
  • (1) 4200-PA Preamp
  • (1) 4210-CVU Capacitance-Voltage Module
  • (1) 8101-PIV Test fixture with sample devices

4200-BTI-A – Ultra-fast NBTI/PBTI

• For sophisticated NBTI and PBTI measurements on leading-edge silicon CMOS technology Package 4200-BTI-A includes:
  • (1) 4225-PMU Ultra-Fast I-V Module
  • (2) 4225-RPM Remote Preamplifier/Switch Modules
  • Automated Characterization Suite (ACS) Software
  • Ultra-Fast BTI Test Project Module
  • Cabling

• Keithley 4200A-SCS-PK3 High Resolution and Power IV & CV - Datasheet (3 MB)