Chroma 11460

| Attributo | Valore |
|---|---|
| Tensione di uscita | 0 - 150 V CC |
| Corrente di uscita massima | 60 A |
| Potenza massima | 1800 W |
| Interfacce di comunicazione | GPIB, RS-232, USB |
| Risoluzione della tensione | 10 mV |
| Risoluzione della corrente | 10 mA |
| Modalità operative | CC, CV, CP, CR |
| Display | Display LCD retroilluminato |
| Dimensioni (L x A x P) | 425 x 88 x 550 mm |
| Alimentazione richiesta | AC 85 - 265 V, 47 - 63 Hz |
Chroma 11460 Options:
- 63200A - A600009 - GPIB cable (200cm)
- 63200A - A600010 - GPIB cable (60cm)
- 63200A - A632000 - Softpanel for 63200A Series
- 63200A - A632006 - NI USB-6211 Bus-Powered Multifunction DAQ
- 63200A - A632007 - Over voltage protection box (for 1200V models only)
- 63200A - A632009 - Slave model (600V/1680A/24kW)
- 63200A - A632010 - Slave model (1200V/960A/24kW)
- 63200A - A636000 - GPIB interface
- 63200A - A636010 - Ethernet interface
- 63200A - B632000 - Handle for 3U models (2kW/3kW)
- 63200A - B632001 - Handle for 4U models (4kW/5kW/6kW)
- 63200A - B632002 - Rack mounting kit for 7U models (8kW/10kW/12kW)
- 63200A - B632003 - Rack mounting kit for 10U models (15kW/18kW)
- 63200A - B632004 - Rack mounting kit for 13U models (20kW/24kW)
| Model | 11460 |
|---|
CHROMA 11460 Soft Panel Kit for 63200A Series DC Electronic Loads
The 63200A series loads can be operated either from the front panel controls or from an available softpanel. This user friendly software includes all the functions of the 63200A series loads and is easy to understand and operate. The 63200A loads can be controlled via standard USB, or optional Ethernet and GPIB interfaces, for remote control and automated testing applications. The 63200A also provides an enhanced feature, User Defined Waveform (UDW), to simulate the actual cur profiles and waveforms. To reconstruct the actual cur waveform, the user can upload captured waveform data into any load via a Chroma softpanel. Each load is capable of storing up to 10 sets of waveforms with each comprising up to 1.5 millions data points to meet the more strenuous test requirements.




