Tektronix TAP1500 Active Probe, 1.5 GHzThe Tektronix TAP1500 single-ended Active FET Probe is a versatile and easy to use probe that provides high-speed electrical and mechanical performance needed for digital system designs. The Tektronix TAP1500 Probe is designed specifically for use and connection to TekVPI™ probe interface.Features and Specifications of the Tektronix TAP1500 Active Probe include:
Features:
Provides high-speed signal acquisition and measurement fidelity:
Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance
DUT attachment accessories provide versatile DUT connectivity for attaching to small SMDs
Preserves instrument bandwidth at the probe tip for ≤1 GHz Oscilloscopes
Connects directly to Oscilloscope with the TekVPI™ probe interface
Provides automatic units scaling and readout on the Oscilloscope display
Easy access to Oscilloscope probe menu display:
for probe status/diagnostic information
to control probe DC offset
Remote GPIB/USB probe control through the Oscilloscope
Applications:
High-speed digital systems design
Component design and characterization
Manufacturing engineering and test
Educational research
Signals with voltage swings up to 16 Vp-p
Specifications:
High Probe Bandwidth: ≥1.5 GHz
Probe Attenuation: 10x ±2%
Fast Probe Rise Time:
Input Capacitance: ≤1 pF
Input Resistance: 1 MΩ
Linear Dynamic Range: ±8 V (16 Vp-p)
Input Offset Range: +10 V
Max Input Voltage (nondestruct): ±15 V (DC + peak AC)
Propagation Delay: 5.3 ns
Provides high-speed signal acquisition and measurement fidelity:
Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance
DUT attachment accessories provide versatile DUT connectivity for attaching to small SMDs
Preserves instrument bandwidth at the probe tip for ≤1 GHz Oscilloscopes
Connects directly to Oscilloscope with the TekVPI™ probe interface
Provides automatic units scaling and readout on the Oscilloscope display
Easy access to Oscilloscope probe menu display:
for probe status/diagnostic information
to control probe DC offset
Remote GPIB/USB probe control through the Oscilloscope
Applications:
High-speed digital systems design
Component design and characterization
Manufacturing engineering and test
Educational research
Signals with voltage swings up to 16 Vp-p
Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance
DUT attachment accessories provide versatile DUT connectivity for attaching to small SMDs
Preserves instrument bandwidth at the probe tip for ≤1 GHz Oscilloscopes
for probe status/diagnostic information
to control probe DC offset
High-speed digital systems design
Component design and characterization
Manufacturing engineering and test
Educational research
Signals with voltage swings up to 16 Vp-p
High Probe Bandwidth: ≥1.5 GHz
Probe Attenuation: 10x ±2%
Fast Probe Rise Time:
Input Capacitance: ≤1 pF
Input Resistance: 1 MΩ
Linear Dynamic Range: ±8 V (16 Vp-p)
Input Offset Range: +10 V
Max Input Voltage (nondestruct): ±15 V (DC + peak AC)
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