Keithley
Keithley 4200-SCS
Semiconductor Characterization System
Semiconductor characterization system Instrument type
DC I-V, C-V, pulsed I-V Measurement types
9 Instrument slots
4200-SMU, 4210-SMU, 4200-PA, 4210-CVU, 4220-PGU, 4225-PMU Supported modules
0.1 fA (4200-PA) Minimum current resolution
| Attribute | Value |
|---|---|
| Instrument type | Semiconductor characterization system |
| Measurement types | DC I-V, C-V, pulsed I-V |
| Instrument slots | 9 |
| Supported modules | 4200-SMU, 4210-SMU, 4200-PA, 4210-CVU, 4220-PGU, 4225-PMU |
| Minimum current resolution | 0.1 fA (4200-PA) |
| Software | KITE |
The Keithley 4200-SCS is a modular semiconductor characterization system for DC I-V, C-V and pulsed I-V measurements on devices, materials and processes. It accepts up to nine plug-in modules, including SMUs with optional preamplifiers, C-V units and pulse generator and pulse measure units, and is operated through Keithley’s KITE software with a library of ready-made tests. It is the predecessor of the 4200A-SCS and remains widely used in semiconductor R&D, reliability and university labs.
Testwall can supply the used Keithley 4200-SCS fully tested, with calibration available on request and delivery across Europe. Send us your requirements and ask for a quote.
