Keysight (Agilent) 4156A Semiconductor Parameter Analyser
Semiconductor Parameter Analyser
| Attribute | Value |
|---|---|
| Number of Source/Monitor Units (SMUs) | 4 SMUs (2 High-Resolution SMUs + 2 Medium-Power SMUs) |
| Voltage Measurement Range | ±0.2 V to ±200 V |
| Current Measurement Range | 1 fA to 100 mA |
| Voltage Source Range | ±0.2 V to ±200 V |
| Current Source Range | ±1 pA to ±100 mA |
| Minimum Current Resolution | 0.1 fA |
| Interface/Connectivity | GPIB (IEEE-488) |
| Display | Built-in CRT display with graphical measurement results |
| Power Supply | 100/120/220/240 VAC, 50/60 Hz |
| Operating Temperature Range | 5°C to 40°C (41°F to 104°F) |
| Model | 4156A |
|---|
The Keysight (Agilent) 4156A offers precision semiconductor analysis with a wide measurement range: current from 1 fA to 1 A (20 fA offset accuracy) and voltage from 1 µV to 200 V. It features fully-automated I-V sweeps in DC or pulse modes, and supports up to 6 SMUs.
With time-domain measurement intervals of 60µs and up to 10,001 points, synchronized stress/measure functions, and high-voltage pulse generators (±40 V), it is ideal for high-accuracy testing.
Testwall can supply the used Keysight (Agilent) 4156A Semiconductor Parameter Analyser, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Keysight (Agilent) 4156A Semiconductor Parameter Analyser.
