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Microchip (Microsemi) 5125A
| Manufacturer | Microchip (Microsemi) |
| Model | 5125A |
| Product | Phase Noise and Allan Deviation Test Set, 1 - 400 MHz |
| Type | Used |
SKU
tw5125A
Microsemi 5125A (call to schedule availability)
The Microsemi 5125A Phase Noise and Allan Deviation (ADEV) Test Set with Ultra Low Noise Floor transforms the way these measurements are made. Traditional measurement instruments require an external phase-lock loop, turning these types of measurements into a complicated and costly endeavor. Compare this with the 5125A, which makes fast yet accurate single sideband (SSB) phase noise and ADEV measurements at the click of a button, all at a fraction of the cost of alternative solutions.
The 5125A employs both direct sampling of the RF waveforms as well as cross correlation, making it possible to easily characterize the highest performance time and frequency references. The third generation, all-digital 5125A has been designed to meet the most demanding requirements. The 5125A can measure phase noise down to -145 dBc/Hz at 1 Hz offset from a 10 MHz carrier and -130 dBc/Hz at 1 Hz offset from a 100 MHz carrier, making it the perfect solution to characterize the very low noise frequency references, such as those used in RADAR and satellite communications.
Microsemi's 5125A is the easiest to use phase noise and ADEV test set in the world: simply connect the device under test (DUT) and reference signal (which can be at a diffe frequency than the DUT) and press the 5125A's green Start button. Seconds later valid measurement data appears on the unit's high resolution display. With the all-digital 5125A, tedious multi-step configuration and calibration routines are no longer required.
The Microsemi 5125A provides phase noise measurement accuracy to previously impossible levels of ±1.0 dB. This combined with the best-in-industry phase noise and ADEV measurement floor means that with the 5125A you can characterize even your lowest noise references more accurately than ever before.
The 5125A is able to support the widest range of phase noise and ADEV measurements of any commercially available product. By converting the DUT and Reference signals to their digital representation as a first step, the patented all-digital design in the 5125A has eliminated the need for carrier suppression when making measurements, enabling phase noise measurements at smaller frequency offsets than previously possible (to below 0.1 mHz).
Features of the Microsemi 5125A include:
- Simultaneous phase noise and Allan Dviation measurements
- 1 - 400 MHz input frequency range
- No external data processing required
- Industry leading accuracy
- Allan Deviation measurements to over 300 days
- Phase noise measurements as close as 0.1 MHz from the carrier
- Displays internal noise estimate
- Excellent phase noise measurements down to -170 dBc/Hz (typical) 10 kHz from the carrier (10 MHz input)
Specifications of the Microsemi 5125A include:
- Performance:
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Frequency range: 1-400 MHz (sinewave)
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Allan deviation:
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Phase Noise Specifications:
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Measurement accuracy: ±1.0 dB
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Offset frequency range: 0.1 mHz to 1 MHz
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System noise floor: ˆ (f) dBc/Hz
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Offset 10 MHz / 100 MHz /400 MHz1 Hz -140 / -120 / -110
10 Hz -150 / -130 / -120
100 Hz -157 / -140 / -130
1 kHz -162 / -150 / -140
10kHz -140 / -120 / -110
>100 kHz -150 / -130 / -120
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System noise floor (typical): ˆ (f) dBc/Hz
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Offset 10 MHz / 100 MHz / 400 MHz1 Hz -145 / -130 / -116
10 Hz -155 / -140 / -126
100 Hz -160 / -150 / -136
1 kHz -165 / -160 / -146
10kHz -170 / -170 / -156
>100 kHz -170 / -170 / -162
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ELECTRICAL SPECIFICATIONS
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nput signal level: 3-17 dBm
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Input impedance: 50W
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Input connectors: TNC (supplied with two BNC adapters)
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