Rohde & Schwarz EX-IQ
| Attribute | Value |
|---|---|
| Sample Rate | 1 kHz to 100 MHz |
| Resolution | 4 to 20 bit per I and Q |
| Interfaces | USB |
| Function | digital I/Q input and output for SMU200A, SMJ100A, AMU200A, FSQ, FSG |
| Clock Rate | up to 100 MHz (parallel), up to 400 MHz (serial LVDS) |
| Logic | LVTTL, CMOS 1.5/1.8/2.5/3.3 V, LVDS |
Rohde & Schwarz EX-IQ Options:
- EX-IQ - EXBOX-B85 - CPRI™ breakout board
- EX-IQ - EXBOX-K10 - CPRI™ RE test
- EX-IQ - EXBOX-K11 - CPRI™ REC test
- EX-IQ - EXBOX-B81 - DigRF SM breakout board
- EX-IQ - EXBOX-K13 - DigRF SM 3G RF-IC test
- EX-IQ - EXBOX-K90 - Waveform memory (64 Msample)
- EX-IQ - EXBOX-K91 - Multiwaveform playback
- EX-IQ - EXBOX-K94 - Recording memory (512 Mbyte)
- EX-IQ - EXBOXK240 - Digital modulation: GSM/EDGE (R&S WinIQSIM2™)
- EX-IQ - EXBOXK241 - Digital modulation: EDGE Evolution (R&S WinIQSIM2™)
- EX-IQ - EXBOXK242 - Digital modulation: 3GPP FDD (R&S WinIQSIM2™)
- EX-IQ - EXBOXK243 - Digital modulation: 3GPP FDD Enhanced BS/MS tests including HSDPA (R&S WinIQSIM2™)
- EX-IQ - EXBOXK245 - Digital modulation: 3GPP FDD Enhanced BS/MS tests including HSUPA (R&S WinIQSIM2™)
- EX-IQ - EXBOXK246 - Digital modulation: CDMA2000® (R&S WinIQSIM2™)
- EX-IQ - EXBOXK247 - Digital modulation: 1xEV-DO (R&S WinIQSIM2™)
- EX-IQ - EXBOXK249 - Digital modulation: IEEE 802.16 (R&S WinIQSIM2™)
- EX-IQ - EXBOXK250 - Digital modulation: TD-SCDMA (3GPP TDD LCR) (R&S WinIQSIM2™)
- EX-IQ - EXBOXK251 - Digital modulation: TD-SCDMA (3GPP TDD LCR) Enhanced BS/MS tests including HSDPA (R&S WinIQSIM2™)
- EX-IQ - EXBOXK254 - Digital modulation: IEEE 802.11n (R&S WinIQSIM2™)
- EX-IQ - EXBOXK255 - Digital modulation: EUTRA/LTE (R&S WinIQSIM2™)
- EX-IQ - EXBOXK259 - Digital modulation: HSPA+ (R&S WinIQSIM2™)
- EX-IQ - EXBOXK284 - Digital modulation: EUTRA/LTE Release 9 and enhanced features (R&S WinIQSIM2™)
- EX-IQ - EXBOXK285 - Digital modulation: EUTRA/LTE Release 10 (R&S WinIQSIM2™)
- EX-IQ - EXBOXK286 - Digital modulation: IEEE 802.11ac (R&S WinIQSIM2™)
The Rohde and Schwarz EX-IQ enables seamless conversion of digital I/Q signals to and from your device under test. It supports flexible, user-defined digital I/Q interface settings and includes two breakout boards with single-ended and differential connectors. Easy interface configuration is managed via R&S®DigIConf software, which also includes a transient recorder for real-time signal visualization. Optional support for CPRI expands its integration flexibility.
Ideal for signal processing applications, the EX-IQ provides robust connectivity and real-time diagnostics for digital interfaces. Its modular setup adapts to various test environments.
Testwall can supply the used Rohde and Schwarz EX-IQ, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Rohde and Schwarz EX-IQ.
