Wayne Kerr 3255BQ
| Attribute | Value |
|---|---|
| Frequency Range | 20 Hz to 3 MHz |
| Measurement Parameters | L, C, R, Z, D, Q, θ, ESR, DCR |
| Basic Accuracy | 0.05% |
| Test Signal Level (Voltage) | 5 mV to 1 V RMS |
| Test Signal Level (Current) | 100 µA to 20 mA RMS |
| DC Bias Voltage | 0 to ±40 V (internal), up to ±200 V (external) |
| DC Bias Current | 0 to 200 mA (internal) |
| Display | Color TFT LCD touchscreen |
| Interface | USB, LAN (LXI), Handler, RS-232 |
| Impedance Range | 1 mΩ to 100 MΩ |
Wayne Kerr 3255BQ Options:
- 3255BQ - /A - 1 mA to 1 A internal DC bias
- 3255BQ - /B - GPIB (IEEE-488) interface
- 3255BQ - /D1 - Bin handler (cannot be fitted with /D2)
- 3255BQ - /D2 - Bin handler opto-coupled (cannot be fitted with /D1)
| Model | 3255BQ |
|---|
The Wayne Kerr 3255BQ is an industrial-grade LCR meter designed for precise measurement of inductance, capacitance, and resistance. It incorporates advanced quality control functions that meet strict industrial standards. With fast and accurate testing capabilities, it supports high-volume component analysis while ensuring excellent repeatability and reliability in results.
Its user-friendly interface ensures smooth workflow, making it suitable for demanding production environments. Operators benefit from robust performance, enabling consistent batch testing with minimal downtime.
Testwall can supply the used Wayne Kerr 3255BQ, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Wayne Kerr 3255BQ.
