Wayne Kerr 3260B
| Attribute | Value |
|---|---|
| Frequency Range | 20 Hz to 3 MHz |
| Basic Impedance Accuracy | 0.1% |
| Measurement Parameters | Z, Y, R, X, G, B, L, C, D, Q, θ, |V|, |I| |
| Test Signal Level (Voltage) | 5 mV to 1 V RMS |
| Test Signal Level (Current) | 50 µA to 20 mA RMS |
| Impedance Measurement Range | 1 mΩ to 100 MΩ |
| DC Bias Voltage | 0 to ±40 V |
| DC Bias Current | 0 to ±100 mA |
| Display | Color LCD Touchscreen |
| Interface | USB, LAN (LXI), Handler |
Wayne Kerr 3260B Options:
- 3260B - /N - Insulation resistance test (500 V)
- 3260B - /G - Analysis function (graphs)
- 3260B - /T - LF Telecom function
- 3260B - /D - Bin handler
| Model | 3260B |
|---|
The Wayne Kerr 3260B is a high-performance LCR analyzer designed for accurate component measurements across a wide frequency range. It delivers fast response times, clear interface outputs, and durable construction, making it suitable for demanding R&D and production environments.
Engineered for precision and usability, the 3260B is ideal for component verification, research applications, and improving workflow productivity. Its robust design ensures consistent and reliable operation over time.
Testwall can supply the used Wayne Kerr 3260B, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Wayne Kerr 3260B.
