Wayne Kerr 6505P
| Attribute | Value |
|---|---|
| Frequency Range | 20 Hz to 500 kHz |
| Measurement Parameters | Z, Y, R, X, G, B, L, C, D, Q, θ, |V|, |I| |
| Basic Accuracy | 0.1% |
| Test Signal Level (Voltage) | 5 mV to 1 V RMS |
| Test Signal Level (Current) | 50 µA to 10 mA RMS |
| DC Bias Voltage | 0 to ±40 V internal, up to ±200 V external |
| DC Bias Current | 0 to 100 mA internal |
| Impedance Range | 1 mΩ to 100 MΩ |
| Display | Color TFT LCD touchscreen |
| Interface | USB, LAN (LXI), Handler, IEEE-488 (GPIB) |
Wayne Kerr 6505P Options:
- 6505P - /B1 - Bin handler (non-isolated 5V)
- 6505P - /B2 - Bin handler (isolated 24V)
- 6505P - /D1 - DC Bias (0 to +40V, 0 to +100mA)
- 6505P - /D2 - DC Bias (-40V to +40V)
| Model | 6505P |
|---|
The Wayne-Kerr 6505P delivers precise, high-speed measurements with programmable functions that streamline automated component analysis. Its flexible setup options support diverse applications, making it an essential tool for advanced production testing and R&D environments requiring accuracy and throughput.
Designed with an intuitive interface, the 6505P simplifies operation while maintaining high-performance standards. Its automation features allow efficient workflow integration, reducing test times and ensuring repeatable, accurate results for demanding applications.
Testwall can supply the used Wayne-Kerr 6505P, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Wayne-Kerr 6505P
