Wayne Kerr 6520P
| Attribute | Value |
|---|---|
| Frequency Range | 20 Hz to 20 kHz |
| Measurement Parameters | L, C, R, Z, D, Q, θ, ESR, G, B, Y |
| Basic Accuracy | 0.1% |
| Test Signal Level | 0.1 V to 1.0 V RMS (programmable) |
| Display | Dual parameter digital display |
| DC Bias | Internal DC bias up to 2 V; External DC bias up to 40 V |
| Interface | IEEE-488 (GPIB) and RS-232 |
| Measurement Speed | Fast, Medium, and Slow measurement modes |
| Component Handler Interface | Built-in handler interface for automated test systems |
| Power Supply | 90–264 V AC, 47–63 Hz |
Wayne Kerr 6520P Options:
- 6520P - /B1 - Bin handler (non-isolated 5V), 25-way D-type connector, common 0V, bin outputs 0 to 5V (nominal) with >10mA current sink capability
- 6520P - /B2 - Bin handler (isolated 24V), 25-way D-type connector, common 24V input, outputs 0 to 24V with >10mA current source capability
- 6520P - /D1 - DC Bias (0 to +40V, 0 to +100mA), provides 0 to +40Vdc bias voltage and 0 to +100mAdc bias current
- 6520P - /D2 - DC Bias (-40V to +40V), provides -40V to +40Vdc bias voltage
| Model | 6520P |
|---|
The Wayne-Kerr 6520P extends the capabilities of the 6520B by adding fully programmable functionality. This enables efficient and automated measurement routines, making it ideal for production environments. It delivers precise component measurements with flexible testing configurations and user-friendly controls.
Designed for high-throughput testing, the 6520P enhances workflow efficiency by supporting automation without compromising measurement accuracy. Its adaptable setup allows seamless integration into varied testing systems.
Testwall can supply the used Wayne-Kerr 6520P, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Wayne-Kerr 6520P.
