Associated Research OMNIA II 8207
| Attribute | Value |
|---|---|
| AC Hipot Test Voltage Range | 100V to 5000V AC |
| DC Hipot Test Voltage Range | 100V to 6000V DC |
| Insulation Resistance Test Voltage | 100V to 1000V DC |
| Ground Bond Test Current | 1A to 30A AC |
| Line Leakage Test | Up to 10mA measurement capability |
| Output Frequency | 50Hz / 60Hz selectable |
| Memory Storage | Up to 100 test steps with programmable sequences |
| Interface / Connectivity | RS-232 and USB interface for remote control and data output |
| Display | Large color LCD touchscreen display |
| Regulatory Compliance | Meets IEC 60950, IEC 62368, UL, CE, and CSA safety standards |
Associated Research OMNIA II 8207 Options:
- OMNIA - Ethernet - Optional Ethernet interface
- OMNIA - GPIB - Optional GPIB interface
- OMNIA - 400/800 Hz - Optional 400/800 Hz output frequency for Dielectric Withstand Test Mode
- OMNIA - Internal Multiplexer (4 port) - Optional internal HV multiplexer, 4 ports
- OMNIA - Internal Multiplexer (8 port) - Optional internal HV multiplexer, 8 ports
| Model | OMNIA |
|---|
The Associated Research OMNIA II 8207 is a 7-in-1 Electrical Safety Compliance Analyzer that integrates AC/DC Hipot, Insulation Resistance, Ground Bond/Continuity, Functional Run, and Line Leakage tests in a single DUT connection. Equipped with a built-in 500VA AC power source, advanced SmartGFI® protection, DualCHEK® technology, and 10,000-step expandable memory, it ensures maximum flexibility and performance for high-demand testing environments.
With interfaces including USB, RS-232, Ethernet, and GPIB, plus an 800x480 TFT LCD color display, the OMNIA II 8207 offers customizable menus, multiple language options, and real-time waveform analysis for precise diagnostics.
Testwall can supply the used Associated Research OMNIA II 8207, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Associated Research OMNIA II 8207.
