Tektronix PPG3204

Tektronix Pattern Generator Tektronix PPG3204 Programmable Pattern Generator, 4 Ch., 32 Gb/sThe Tektronix PatternPro® series programmable pattern generators provide up to four channels of stressed pattern generation for high-speed Datacom testing.The Tektronix PatternPro® line of high-performance pattern generators offer single and multi-channel configurations capable of data rates up to 32 Gb/s. With optional jitter insertion, the PPG line offers a flexible, cost effective and easy to use test solution supporting high speed applications such as 100 Gigabit Ethernet, 32G Fibre channel, PAM4, DP-QPSK testing, and a broad range of receiver test applications. The single unit multi-channel configurations provide aligned, pattern-independent data outputs that support testing of crosstalk immunity and multi-channel functionality. The PPG line can be paired with the Tektronix PED line of Error Detector products to provide a complete BER test capability. Data rate may be programmed over a broad range of values. (32 Gb/s version shown) Output may be either built-in PRBS patterns or programmed user data patterns.Features and Specifications of the Tektronix PPG3204 includes:

• Low inhe jitter (typical RJ
• 8 ps typical 20% to 80% rise/fall times (PPG3200 fixed output models)
• 11 ps typical 20% to 80% rise/fall times (PPG3200 with Option ADJ)
• Variable output amplitude:
  • 300 mV to 1.0 V for PPG3200 with Option ADJ
  • 250 mV to 2.0 V for PPG1600 and PPG3000 series
• Low frequency, high amplitude jitter insertion range of 10 Hz to 10 MHz at up to 5000 UI (PPG3200 series with Option LFJIT)
• BUJ amplitudes up to 50 ps_p-p with modulation rates up to 2.5 Gb/s (with Option HFJIT)
• 35% to 65% programmable crossing point (PPG1600 & PPG3000 series)

• Available with 1, 2, or 4 output channels of 16, 30, or 32 Gb/s (independent data on all channels)
• Provides full end-to-end multi-channel BER test solution when paired with the PED series error detector
• Jitter insertion options include BUJ, SJ, RJ, and PJ
• Aligned data on multi-channel units
• Full rate built-in adjustable clock source
• DC coupled diffeial data outputs
• Programmable output amplitude, offset, and crossing point
• PRBS and user defined patterns
• Adjustable channel phase delay
• Front panel touch screen GUI or USB computer control

• Multi-channel 25 Gb/s testing for 100 G Ethernet
• DQPSK and DP-QPSK testing
• CFP2 and CFP4 testing
• Multi-level signal testing
• Semiconductor and component testing

Low inhe jitter (typical RJ

8 ps typical 20% to 80% rise/fall times (PPG3200 fixed output models)

11 ps typical 20% to 80% rise/fall times (PPG3200 with Option ADJ)

Variable output amplitude:

• 300 mV to 1.0 V for PPG3200 with Option ADJ
• 250 mV to 2.0 V for PPG1600 and PPG3000 series

Low frequency, high amplitude jitter insertion range of 10 Hz to 10 MHz at up to 5000 UI (PPG3200 series with Option LFJIT)

BUJ amplitudes up to 50 ps_p-p with modulation rates up to 2.5 Gb/s (with Option HFJIT)

35% to 65% programmable crossing point (PPG1600 & PPG3000 series)

300 mV to 1.0 V for PPG3200 with Option ADJ

250 mV to 2.0 V for PPG1600 and PPG3000 series

Available with 1, 2, or 4 output channels of 16, 30, or 32 Gb/s (independent data on all channels)

Provides full end-to-end multi-channel BER test solution when paired with the PED series error detector

Jitter insertion options include BUJ, SJ, RJ, and PJ

Aligned data on multi-channel units

Full rate built-in adjustable clock source

DC coupled diffeial data outputs

Programmable output amplitude, offset, and crossing point

PRBS and user defined patterns

Adjustable channel phase delay

Front panel touch screen GUI or USB computer control

Multi-channel 25 Gb/s testing for 100 G Ethernet

DQPSK and DP-QPSK testing

CFP2 and CFP4 testing

Multi-level signal testing

Semiconductor and component testing