Keysight (Agilent)
Keysight (Agilent) 93000
Semiconductor Test System (SoC/IC Test) Test Category
Up to 1024 pins (scalable architecture) Pin Scale
Up to 1.6 Gbps per pin Maximum Data Rate
<1 ps RMS jitter (typical) Timing Accuracy
-2 V to +7 V (pin electronics) Voltage Force Range
| Attribute | Value |
|---|---|
| Test Category | Semiconductor Test System (SoC/IC Test) |
| Pin Scale | Up to 1024 pins (scalable architecture) |
| Maximum Data Rate | Up to 1.6 Gbps per pin |
| Timing Accuracy | <1 ps RMS jitter (typical) |
| Voltage Force Range | -2 V to +7 V (pin electronics) |
| Current Measurement Range | 1 nA to 512 mA |
| Pattern Memory Depth | Up to 256 Mb per pin |
| Operating Frequency | DC to 1600 MHz |
| Platform Architecture | Modular, scalable SoC test platform with shared resource architecture |
| Software Environment | Keysight SmarTest software, supports STIL, WGL, and ASCII pattern formats |
| Model | 93000 |
|---|
The Keysight (Agilent) 93000 is a cutting-edge System-on-Chip (SoC) test platform designed for digital, analog, RF, and mixed-signal device testing. It features a modular architecture, parallel testing capabilities, and supports high pin-count configurations, enabling high-throughput and precision testing for complex semiconductors. Integrated debugging tools and a user-friendly interface streamline development and analysis. Ideal for semiconductor manufacturing, design verification, and quality assurance across industries like automotive and consumer electronics. Its scalable design simplifies test workflows and reduces system requirements. Testwall can supply the used Keysight (Agilent) 93000, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Keysight (Agilent) 93000.
