Tektronix BSA125C
| Attribute | Value |
|---|---|
| Data Rate | Up to 12.5 Gb/s |
| Number of Channels | 1 |
| Optical Wavelength Range | 750 nm to 1650 nm |
| Electrical Input Bandwidth | 12.5 GHz |
| Clock Recovery | Integrated clock recovery up to 12.5 Gb/s |
| Jitter Measurement Floor (RJ) | Less than 100 fs RMS |
| Timing Resolution | Less than 1 ps |
| Display | 10.4-inch color LCD touchscreen |
| Interface/Connectivity | USB, GPIB, Ethernet (LAN) |
| Operating Temperature | 0°C to 50°C (32°F to 122°F) |
Tektronix BSA125C Options:
- BSA125C - Opt. F2 - F/2 Jitter Generation at 8G/10.3125G (requires STR)
- BSA125C - Opt. STR - Stressed Signal Generation (includes option ECC, MAP, PL, XSSC, JTOL)
- BSA125C - Opt. XSSC - Extended Spread Spectrum Clocking (SSC) (included in STR)
- BSA125C - Opt. PCISTR - Add PCIe Gen2 Extended Stress Generation
- BSA125C - Opt. J-MAP - Add Jitter Decomposition SW
- BSA125C - Opt. ECC - Add Error Correction Coding Emulation SW (included in STR)
- BSA125C - Opt. JTOL - Add Jitter Tolerance Templates SW (included in STR)
- BSA125C - Opt. LDA - Add Live Data Analysis SW
- BSA125C - Opt. MAP - Add Error Mapping Analysis SW (included in STR)
- BSA125C - Opt. PL - Add Physical Layer Test Suite SW (included in STR)
- BSA125C - Opt. PVU - Add PatternVu Equalization Processing SW
- BSA125C - Opt. SF - Add Symbol Filtering option SW (used with STR)
- BSA125C - Opt. SLD - Add Stressed Live Data option SW
- BSA125C - Opt. CA1 - Provides a single calibration event or coverage
- BSA125C - Opt. C3 - Calibration Service 3 Years
- BSA125C - Opt. R3 - Repair Service 3 Years (including warranty)
- BSA125C - Opt. R3DW - Repair Service Coverage 3 Years (includes product warranty period). 3-year period starts at time of customer instrument purchase
| Model | BSA125C |
|---|
The Tektronix BSA125C BERTScope™ Tester is engineered for high-speed serial data analysis, offering Bit Error Ratio (BER) measurements up to 12.5 Gb/s. It integrates calibrated stress generation, sinusoidal jitter to 100 MHz, and advanced jitter decomposition using PRBS-31 patterns. It supports PCIe, Ethernet, USB 3.0, and other standards with extensive error and jitter tolerance testing capabilities.
Ideal for compliance testing, the BSA125C includes eye diagram analysis, BER correlation, and patented Error Location Analysis™ for assessing deterministic versus random errors across complex data systems.
Testwall can supply the used Tektronix BSA125C, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Tektronix BSA125C.
