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Tektronix TAP3500 Active Probe, 2 .5 GHzThe Tektronix TAP3500 single-ended Active FET Probe is a versatile and easy to use probe that provides high-speed electrical and mechanical performance needed for digital system designs. The Tektronix TAP3500 Probe is designed specifically for use and connection to TekVPI™ probe interface.Features and Specifications of the Tektronix TAP3500 Active Probe include: Features: Specifications: Provides high-speed signal acquisition and measurement fidelity: Connects directly to Oscilloscope with the TekVPI™ probe interface Provides automatic units scaling and readout on the Oscilloscope display Easy access to Oscilloscope probe menu display: Remote GPIB/USB probe control through the Oscilloscope Applications: Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance DUT attachment accessories provide versatile DUT connectivity for attaching to small SMDs Preserves instrument bandwidth at the probe tip for ≤1 GHz Oscilloscopes for probe status/diagnostic information to control probe DC offset Verification, debug, and characterization of high-speed designs Signal integrity, jitter, and timing analysis Manufacturing engineering and test Educational research Signals with voltage swings up to 8 Vpk-pk High Probe Bandwidth: ≥3.5 GHz Probe Attenuation: 10:1 Fast Probe Rise Time: Input Capacitance: ≤0.8 pF Input Resistance: 40 kΩ Input Dynamic Range: –4 V to +4 V Input Offset Range: –10 V to +10 V Max Input Voltage (nondestruct): ±30 V (DC + peak AC) Propagation Delay: 5.3 ns
- Provides high-speed signal acquisition and measurement fidelity:
- Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance
- DUT attachment accessories provide versatile DUT connectivity for attaching to small SMDs
- Preserves instrument bandwidth at the probe tip for ≤1 GHz Oscilloscopes
- Connects directly to Oscilloscope with the TekVPI™ probe interface
- Provides automatic units scaling and readout on the Oscilloscope display
- Easy access to Oscilloscope probe menu display:
- for probe status/diagnostic information
- to control probe DC offset
- Remote GPIB/USB probe control through the Oscilloscope
- Applications:
- Verification, debug, and characterization of high-speed designs
- Signal integrity, jitter, and timing analysis
- Manufacturing engineering and test
- Educational research
- Signals with voltage swings up to 8 Vpk-pk
- High Probe Bandwidth: ≥3.5 GHz
- Probe Attenuation: 10:1
- Fast Probe Rise Time:
- Input Capacitance: ≤0.8 pF
- Input Resistance: 40 kΩ
- Input Dynamic Range: –4 V to +4 V
- Input Offset Range: –10 V to +10 V
- Max Input Voltage (nondestruct): ±30 V (DC + peak AC)
- Propagation Delay: 5.3 ns
- Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance
- DUT attachment accessories provide versatile DUT connectivity for attaching to small SMDs
- Preserves instrument bandwidth at the probe tip for ≤1 GHz Oscilloscopes
- for probe status/diagnostic information
- to control probe DC offset
- Verification, debug, and characterization of high-speed designs
- Signal integrity, jitter, and timing analysis
- Manufacturing engineering and test
- Educational research
- Signals with voltage swings up to 8 Vpk-pk
