Wayne Kerr 1J65120BD1
| Attribute | Value |
|---|---|
| Frequency Range | 20 Hz - 120 MHz |
| Measurement Parameters | L, C, R, Z, D, Q, θ, ESR |
| Basic Accuracy | 0.1% |
| Test Signal Level | 5 mV to 1 V RMS |
| Display | Color LCD Touchscreen |
| Interface | USB, LAN (LXI), GPIB |
| DC Bias Voltage | 0 to ±40 V |
| Impedance Range | 1 mΩ to 100 MΩ |
| Power Supply | 100-240 V AC, 50/60 Hz |
| Operating Temperature | 0°C to 40°C |
Wayne Kerr 1J65120BD1 Options:
- 1J65120BD1 - /B1 - Bin handler (non-isolated 5V)
- 1J65120BD1 - /B2 - Bin handler (isolated 24V)
- 1J65120BD1 - /D1 - DC Bias (0 to +40V, 0 to +100mA)
- 1J65120BD1 - /D2 - DC Bias (-40V to +40V)
- 1J65120BD1 - /E - Equivalent Circuit Analysis
- 1J65120BD1 - /K - Material Test
- 1J65120BD1 - /M - Multi-Measurement Mode
- 1J65120BD1 - /Y - Polar Complex Plots
| Model | 1J65120BD1 |
|---|
The Wayne-Kerr 1J65120BD1 is a high-performance component analyzer engineered for precision testing. It provides wide-range measurement capabilities with exceptional accuracy, ensuring reliable data across demanding applications. Its compact yet powerful design supports both laboratory and field environments, maintaining consistent results with superior stability.
With flexible configuration options, the Wayne-Kerr 1J65120BD1 adapts to diverse testing requirements. It is particularly effective for high-frequency applications where uncompromising accuracy is essential. This analyzer is an excellent choice for detailed and repeatable component analysis.
Testwall can supply the used Wayne-Kerr 1J65120BD1, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Wayne-Kerr 1J65120BD1.
