Wayne Kerr 3245
| Attribute | Value |
|---|---|
| Measurement Function | LCR Meter / Component Analyzer |
| Frequency Range | 20 Hz to 1 MHz |
| Basic Accuracy | 0.05% |
| Test Signal Level | 5 mV to 1 V RMS (programmable) |
| Measurement Parameters | L, C, R, Z, Q, D, θ, G, B, X, Y, Vdc, Idc |
| Display | Dual parameter simultaneous display |
| Interface | IEEE-488 (GPIB) and RS-232 |
| Measurement Speed | Fast, Medium, and Slow measurement modes |
| DC Bias | Internal DC bias voltage and current capability |
| Power Supply | 90–250 V AC, 47–63 Hz |
| Model | 3245 |
|---|
The Wayne Kerr 3245 is a high-performance LCR meter designed to measure inductance, capacitance, and resistance with precision. Offering a wide frequency range, fast measurement speeds, and excellent accuracy, it supports both R&D and production environments. Its intuitive interface ensures clear data presentation and efficient workflow, making it suitable for diverse electronic testing applications.
Engineers can use the instrument for quality assurance, manufacturing, and development tasks, where repeatable and reliable results are essential for component testing and validation.
Testwall can supply the used Wayne Kerr 3245, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Wayne Kerr 3245.
