Wayne Kerr
Wayne Kerr 6510P
High Frequency LCR Meter, 10 MHz
20 Hz to 10 MHz Frequency Range
0.1% Basic Impedance Accuracy
Z, Y, R, X, G, B, L, C, D, Q, θ, Rp, Rs, Lp, Ls, Cp, Cs Measurement Parameters
5 mV to 1 V RMS Test Signal Level (Voltage)
0.1 mA to 20 mA RMS Test Signal Level (Current)
| Attribute | Value |
|---|---|
| Frequency Range | 20 Hz to 10 MHz |
| Basic Impedance Accuracy | 0.1% |
| Measurement Parameters | Z, Y, R, X, G, B, L, C, D, Q, θ, Rp, Rs, Lp, Ls, Cp, Cs |
| Test Signal Level (Voltage) | 5 mV to 1 V RMS |
| Test Signal Level (Current) | 0.1 mA to 20 mA RMS |
| Impedance Range | 1 mΩ to 100 MΩ |
| Display | Large backlit LCD with simultaneous primary and secondary parameter display |
| Interface / Connectivity | USB, RS-232, GPIB (optional), Handler interface |
| DC Bias Voltage | 0 to ±40 V internal DC bias |
| Measurement Speed | Fast, Medium, and Slow measurement modes available |
Wayne Kerr 6510P Options:
- 6510P - /B1 - Bin handler (non-isolated 5V), 25-way D-type connector
- 6510P - /B2 - Bin handler (isolated 24V), 25-way D-type connector
- 6510P - /D1 - DC Bias (0 to +40V, 0 to +100mA)
- 6510P - /D2 - DC Bias (-40V to +40V)
| Model | 6510P |
|---|
The Wayne-Kerr 6510P offers advanced programmability for LCR testing, enabling precise measurements of inductance, capacitance, and resistance. With configurable settings and automated workflows, it enhances accuracy and efficiency for production and research environments.
Its high-speed testing capabilities make it ideal for repetitive tasks in QA and R&D applications, while the intuitive interface ensures user-friendly operation across various setups.
Testwall can supply the used Wayne-Kerr 6510P, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Wayne-Kerr 6510P.
