Tektronix TDP3500 Diffeial Probe, 1.5 GHzThe Tektronix TDP3500 Probe is a Diffeial-ended Active probe that provides truer signal reproduction and fidelity for high-frequency measurements. It also provides high-speed electrical and mechanical performance required for today’s digital system designs. The Tektronix TDP3500 Probe is designed specifically for use, and direct connection to, Tektronix Oscilloscopes with the TekVPI™ probe interface.Features and Specifications of the TDP3500 Diffeial Probe include:
Features:
- Outstanding electrical performance:
- Bandwidth that provides accurate measurements for serial and digital applications
- Excellent common mode rejection that reduces measurement errors in higher common environments
- Low capacitive and resistive loading:
- Maintains signal fidelity
- Reduces DC biasing interactions
- Versatile mechanical performance:
- Compact probe head size for probing small geometry circuit elements
- DUT attachment accessories enable connection to fine-spaced SMDs
- Robust design for reliability
- Connects directly to Oscilloscope with the TekVPI™ probe interface
- Provides automatic units scaling and readout on the Oscilloscope display
- Embeds the probe characteristics within the Oscilloscope
- Easy access to probe comp box controls or Oscilloscope probe menu display for:
- probe status
- probe setup control
- diagnostic information
- Integrated Scope/Probe System:
- Direct connection to and powered from the TekVPI™ Oscilloscope Interface without the need of an external power supply
- Single-button Oscilloscope probe menu access
- Setup and control from comp box or Oscilloscope user interface
- AutoZero: Zeros out output offset
- Remote GPIB/USB probe control through the Oscilloscope
- Applications:
- Design, validation, degugging, and characterization of common high-speed serial bus designs:
- I2C
- CAN/LIN
- SPI
- Serial ATA
- Ethernet (GbE)
- USB 2.0
- Firewire (1394b)
- Signal integrity, jitter, and timing analysis
- Manufacturing, engineering and test
Specifications:
- Probe Bandwidth: ≥3.5 GHz warranted
- Probe Attenuation: 5x
- Probe Rise Time: ≤110 ps typical
- Diffeial Input Capacitance: ≤0.3 pF
- Diffeial Input Resistance: 100 kΩ
- Diffeial Input Dynamic Range: ±2 V
- CMRR:
- >60 dB at 1 MHz
- >25 dB at 1 GHz
- Input Offset Range: ±1 V displayed
- Operation Voltage Input Range (Common Mode Input Range): +5 V to -4V
- Noise: ≈35 nV/root Hz
- Max Input Voltage (Nondestruct): ±15 V (DC + pk AC)
- Propagation Delay: 5.4 ns typical
Outstanding electrical performance:
- Bandwidth that provides accurate measurements for serial and digital applications
- Excellent common mode rejection that reduces measurement errors in higher common environments
- Low capacitive and resistive loading:
- Maintains signal fidelity
- Reduces DC biasing interactions
Versatile mechanical performance:
- Compact probe head size for probing small geometry circuit elements
- DUT attachment accessories enable connection to fine-spaced SMDs
- Robust design for reliability
Connects directly to Oscilloscope with the TekVPI™ probe interface
Provides automatic units scaling and readout on the Oscilloscope display
Embeds the probe characteristics within the Oscilloscope
Easy access to probe comp box controls or Oscilloscope probe menu display for:
- probe status
- probe setup control
- diagnostic information
Integrated Scope/Probe System:
- Direct connection to and powered from the TekVPI™ Oscilloscope Interface without the need of an external power supply
- Single-button Oscilloscope probe menu access
- Setup and control from comp box or Oscilloscope user interface
- AutoZero: Zeros out output offset
- Remote GPIB/USB probe control through the Oscilloscope
Applications:
- Design, validation, degugging, and characterization of common high-speed serial bus designs:
- I2C
- CAN/LIN
- SPI
- Serial ATA
- Ethernet (GbE)
- USB 2.0
- Firewire (1394b)
- Signal integrity, jitter, and timing analysis
- Manufacturing, engineering and test
Bandwidth that provides accurate measurements for serial and digital applications
Excellent common mode rejection that reduces measurement errors in higher common environments
Low capacitive and resistive loading:
- Maintains signal fidelity
- Reduces DC biasing interactions
Maintains signal fidelity
Reduces DC biasing interactions
Compact probe head size for probing small geometry circuit elements
DUT attachment accessories enable connection to fine-spaced SMDs
Robust design for reliability
probe status
probe setup control
diagnostic information
Direct connection to and powered from the TekVPI™ Oscilloscope Interface without the need of an external power supply
Single-button Oscilloscope probe menu access
Setup and control from comp box or Oscilloscope user interface
AutoZero: Zeros out output offset
Remote GPIB/USB probe control through the Oscilloscope
Design, validation, degugging, and characterization of common high-speed serial bus designs:
- I2C
- CAN/LIN
- SPI
- Serial ATA
- Ethernet (GbE)
- USB 2.0
- Firewire (1394b)
Signal integrity, jitter, and timing analysis
Manufacturing, engineering and test
I2C
CAN/LIN
SPI
Serial ATA
Ethernet (GbE)
USB 2.0
Firewire (1394b)
Probe Bandwidth: ≥3.5 GHz warranted
Probe Attenuation: 5x
Probe Rise Time: ≤110 ps typical
Diffeial Input Capacitance: ≤0.3 pF
Diffeial Input Resistance: 100 kΩ
Diffeial Input Dynamic Range: ±2 V
CMRR:
- >60 dB at 1 MHz
- >25 dB at 1 GHz
Input Offset Range: ±1 V displayed
Operation Voltage Input Range (Common Mode Input Range): +5 V to -4V
Noise: ≈35 nV/root Hz
Max Input Voltage (Nondestruct): ±15 V (DC + pk AC)
Propagation Delay: 5.4 ns typical
>60 dB at 1 MHz
>25 dB at 1 GHz