Tektronix TDS8000

ManufacturerTektronix
ModelTDS8000

 

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SKU
78127
TEKTRONIX TDS8000 The Tektronix TDS8000 digital sampling oscilloscope offers a wide range of on-board measurement and waveform-processing capabilities. With excellent measurement repeatability, exceptional vertical resolution and fast waveform acquisition and display update rates, the Tek TDS8000 is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages and cables and high-speed digital communications. The Tektronix TDS8000 scopes' timebase provides equivalent time sweep speeds from 0.5?ps/div to 5?ms/div with record lengths from 20 to 4000?points and a sample interval of 10?femtoseconds (0.01?ps). In addition, the TDS8000 sampling oscilloscopes' timebases can be locked to a 10?MHz reference providing greater long-term stability. This capability also allows multiple TDS8000s to be synchronized to other test equipment and/or the device-under-test. SIGNAL ACQUISITION Acquisition Modes -?Sample (normal), envelope and average. Number of Sampling Modules Accommodated -?Up to four dual-channel electrical and two single-channel optical sampling modules. Number of Simultaneously Acquired Inputs -?8 channels maximum (8?electrical or 2?optical and 6?electrical).
VERTICAL SYSTEMS
Rise Time/Bandwidth -?Determined by the sampling modules used. Vertical Resolution -?14-Bit over the sampling module's dynamic range.
HORIZONTAL SYSTEM
Main and Magnification View Timebases -?1 ps/div to 5?ms/div in 1-2-5?sequence or 1?ps increments. Time Interval Accuracy - Horizontal sensitivity < 21 ps: 1 ps +1% of interval. Horizontal sensitivity >21 ps: Horizontal deskew range : -500?ps to +100?ns on any individual channel in 1?ps increments. Record Length -?20, 50, 100, 500, 1000, 2000 or 4000 samples. Magnification Views -?In addition to the main timebase, the TDS8000 supports two magnification views. These magnifications are independently acquired using separate timebase settings. Maximum Trigger Rate -?200 kHz.
TRIGGER SYSTEM
Trigger Sources - External direct trigger. External pre-scaled trigger. Internal clock trigger: internally connected to direct trigger. Clock recovery triggers (from optical sampling modules): internally connected to pre-scaled trigger. Trigger Sensitivity - External direct trigger input: Pre-scaled trigger input: Jitter - Short-term jitter optimized mode: Locked to 10?MHz reference: Internal Clock -?Adjustable from 25 to 200?kHz (drives TDR, internal clock output and calibrator). Trigger Level Range -??1.0?V. Trigger Input Range -??1.5?V. Trigger Holdoff -?Adjustable 5 ?s to 100?ms in 2?ns increments.
DISPLAY FEATURES
Touchscreen Display -?10.4 in. diagonal, color. Colors -?16,777,216 (24 bits). Video Resolution -?640 horizontal by 480 vertical displayed pixels.
MATH/MEASUREMENT SYSTEM MEASUREMENTS
The TDS8000 supports up to eight simultaneous measurements, updated 3?times per second with optional display of per measurement statistics (min, max, mean and standard deviation). Measurement Set - Amplitude measurements: High, Low, Amplitude, Max, Mid, Min, Peak-to-Peak, +?Overshoot, -?Overshoot, Mean, Cycle Mean, RMS, Cycle RMS, AC RMS, Gain. Timing measurements: Rise, fall, period, frequency, +?cross, -?cross, +?width, -?width, +?duty cycle, -?duty cycle, burst width, delay, phase. Area measurements: Area, Cycle Area. Eye pattern/optical measurements: Extinction Ratio (Ratio, %, dB), Eye Width, Eye Height, Crossing?%, Duty Cycle Distortion, Jitter (pk-pk, RMS), Noise (pk-pk, RMS), Q-Factor, SNR, Average Optical Power. Cursors -?Dot, vertical bar and horizontal bar cursors.
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