Wayne Kerr 6550P
| Attribute | Value |
|---|---|
| Frequency Range | 20 Hz to 500 kHz |
| Measurement Parameters | L, C, R, Z, D, Q, θ, ESR, G, B, Y |
| Basic Accuracy | 0.1% |
| Test Signal Level (Voltage) | 5 mV to 1 V RMS |
| Display | Large backlit LCD with dual parameter display |
| DC Bias | Internal DC bias up to 2 V; compatible with external bias up to 40 V |
| Interface | USB, RS-232, Handler interface |
| Measurement Speed | Fast, Medium, and Slow measurement modes |
| Component Connection | 4-terminal Kelvin test fixture connection |
| Power Supply | 90 to 264 V AC, 47 to 63 Hz |
Wayne Kerr 6550P Options:
- 6550P - /B1 - Bin handler (non-isolated 5V)
- 6550P - /B2 - Bin handler (isolated 24V)
- 6550P - /D1 - DC Bias (0 to +40V, 0 to +100mA)
- 6550P - /D2 - DC Bias (-40V to +40V)
| Model | 6550P |
|---|
The Wayne-Kerr 6550P is a high-performance programmable LCR analyzer designed for precision testing of capacitors, inductors, and resistors. It features advanced automation through programmable test routines, ideal for repetitive measurements in R&D and production environments. Operating across a broad frequency range, it ensures fast and accurate measurements, supporting complex component analysis with unmatched efficiency.
With its wide frequency coverage, fast measurement speed, and reliable accuracy, the 6550P suits both laboratory and high-volume production needs.
Testwall can supply the used Wayne-Kerr 6550P, fully tested. With expert support and global delivery, Testwall ensures high-performance instrumentation with unmatched reliability and service quality. Please contact us directly if you need calibration or repair of the Wayne-Kerr 6550P.
